In Situ Synchrotron Radiation X-ray Diffraction Study on Phase and Oxide Growth during a High Temperature Cycle of a NiTi-20 at.% Zr High Temperature Shape Memory Alloy

Abstract

Ternary additions to binary NiTi shape memory alloys are known to significantly affect the characteristic martensite-to-austenite phase transformation, i.e., decrease or increase transformation temperatures. High temperature shape memory alloys can be created by adding Au, Pt, Pd, Hf, or Zr to binary NiTi in appropriate amounts; however, the majority of these ternary additions are exceedingly expensive, unfortunately making them impractical for most commercial applications. Zr is the exception of the group, but it is often disregarded because of its poor workability and thermal stability. In an effort to find a temperature range that allows for the potential workability of NiTiZr alloys in normal atmosphere environments and to gain understanding as to the cause of failure during processing, a NiTi-20 at.% Zr was subjected to a thermal cycle ranging from RT to 1000 °C with short 15 min holds at select temperatures during both heating and cooling while simultaneously collecting high-energy synchrotron radiation X-ray diffraction measurements. This study provides valuable insight into the kinetics of precipitation and oxide formation and its relationship to processing. In addition, scanning electron microscopy was performed on five samples, each isothermally held to examine precipitation and oxide structure and growth.

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